Replacing the AD9747, the GX9747 16-bit 250MSPS digital-to-analog converter is used in communication test platforms.

In the R&D and production testing of wireless communication equipment, the test platform needs to generate high-fidelity modulated signals to stimulate the device under test. Whether it is the adjacent channel leakage ratio test of base station RF modules or the receiver sensitivity verification, the error vector magnitude and spurious suppression capability of the signal source itself directly determine the confidence level of the test results.

The GX9747 is a dual-channel, 16-bit resolution, current-output digital-to-analog converter with a maximum sampling rate of 250MSPS, optimized for direct conversion transmit applications. It features low noise and low intermodulation distortion, and achieves an ACLR of up to 80dBc at a 61.44MHz intermediate frequency under single-carrier W-CDMA conditions. Its switching output stage allows the synthesis of usable signals above the Nyquist frequency, and the dual-channel architecture performs synchronous conversion of the I/Q baseband signals, making it highly suitable for complex modulated signal generation tasks in communication test platforms.

GX9747 features:

High dynamic range, dual DAC

Low noise and intermodulation distortion

Single-carrier W-CDMA ACLR = 80dBc (61.55MHz)

Innovative switching output stage, allowing output frequencies above the Nyquist frequency

LVCMOS inputs including dual-port or selectable interleaved single-port operation

Differential analog current output programmable from 8.6mA to 31.7mA

Auxiliary 10-bit current DAC with sink/source capability, usable for external zero-compensation circuits

Built-in 1.2V precision reference voltage source

Operating supply: 1.8V–3.3V

Power consumption: 315mW

QFN72 package, replacing the AD9747